A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits.

Murari Mani Anirudh Devgan Michael Orshansky Yaping Zhan A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits. 1790-1802 2007 26 IEEE Trans. on CAD of Integrated Circuits and Systems 10 http://dx.doi.org/10.1109/TCAD.2007.895797 db/journals/tcad/tcad26.html#ManiDOZ07