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DBLP BibTeX Record 'journals/tcad/LiouKJC03'

@article{DBLP:journals/tcad/LiouKJC03,
  author    = {Jing-Jia Liou and
               Angela Krstic and
               Yi-Min Jiang and
               Kwang-Ting Cheng},
  title     = {Modeling, testing, and analysis for delay defects and noise
               effects in deep submicron devices},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {22},
  number    = {6},
  year      = {2003},
  pages     = {756-769},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2003.811442},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}