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BibTeX record journals/tcad/LienLHA13
@article{DBLP:journals/tcad/LienLHA13, author = {Wei{-}Cheng Lien and Kuen{-}Jong Lee and Tong{-}Yu Hsieh and Wee{-}Lung Ang}, title = {An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {32}, number = {8}, pages = {1254--1264}, year = {2013}, url = {https://doi.org/10.1109/TCAD.2013.2253155}, doi = {10.1109/TCAD.2013.2253155}, timestamp = {Thu, 14 Oct 2021 09:40:27 +0200}, biburl = {https://dblp.org/rec/journals/tcad/LienLHA13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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