BibTeX record journals/tcad/LienLHA13

download as .bib file

@article{DBLP:journals/tcad/LienLHA13,
  author       = {Wei{-}Cheng Lien and
                  Kuen{-}Jong Lee and
                  Tong{-}Yu Hsieh and
                  Wee{-}Lung Ang},
  title        = {An Efficient On-Chip Test Generation Scheme Based on Programmable
                  and Multiple Twisted-Ring Counters},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {32},
  number       = {8},
  pages        = {1254--1264},
  year         = {2013},
  url          = {https://doi.org/10.1109/TCAD.2013.2253155},
  doi          = {10.1109/TCAD.2013.2253155},
  timestamp    = {Thu, 14 Oct 2021 09:40:27 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/LienLHA13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.