BibTeX record journals/tcad/LiYCRKX22

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@article{DBLP:journals/tcad/LiYCRKX22,
  author       = {Qiao Li and
                  Min Ye and
                  Yufei Cui and
                  Tianyu Ren and
                  Tei{-}Wei Kuo and
                  Chun Jason Xue},
  title        = {Resolving the Reliability Issues of Open Blocks for 3-D {NAND} Flash:
                  Observations and Strategies},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {41},
  number       = {11},
  pages        = {4076--4087},
  year         = {2022},
  url          = {https://doi.org/10.1109/TCAD.2022.3197487},
  doi          = {10.1109/TCAD.2022.3197487},
  timestamp    = {Sat, 30 Sep 2023 10:27:50 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/LiYCRKX22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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