BibTeX
@article{DBLP:journals/tcad/LiCLSC07,
author = {Katherine Shu-Min Li and
Yao-Wen Chang and
Chung-Len Lee and
Chauchin Su and
Jwu E. Chen},
title = {Multilevel Full-Chip Routing With Testability and Yield
Enhancement},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {26},
number = {9},
year = {2007},
pages = {1625-1636},
ee = {http://dx.doi.org/10.1109/TCAD.2007.895587},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-04-08 by Michael Ley (ley@uni-trier.de)