BibTeX record journals/tcad/LeePRK20

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@article{DBLP:journals/tcad/LeePRK20,
  author       = {Yongwoo Lee and
                  Jaehyun Park and
                  Junhee Ryu and
                  Younghyun Kim},
  title        = {AxFTL: Exploiting Error Tolerance for Extending Lifetime of {NAND}
                  Flash Storage},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {39},
  number       = {11},
  pages        = {3239--3249},
  year         = {2020},
  url          = {https://doi.org/10.1109/TCAD.2020.3013070},
  doi          = {10.1109/TCAD.2020.3013070},
  timestamp    = {Mon, 19 Dec 2022 20:39:13 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/LeePRK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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