DBLP Record 'journals/tcad/LeeP96'

BibTeX

@article{DBLP:journals/tcad/LeeP96,
  author    = {Jaushin Lee and
               Janak H. Patel},
  title     = {Hierarchical test generation under architectural level functional
               constraints},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {15},
  number    = {9},
  year      = {1996},
  pages     = {1144-1151},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/43.536720},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}