BibTeX record journals/tcad/LeeNB94

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@article{DBLP:journals/tcad/LeeNB94,
  author       = {Kuen{-}Jong Lee and
                  Charles Njinda and
                  Melvin A. Breuer},
  title        = {SWiTEST: a switch level test generation system for {CMOS} combinational
                  circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {13},
  number       = {5},
  pages        = {625--637},
  year         = {1994},
  url          = {https://doi.org/10.1109/43.277636},
  doi          = {10.1109/43.277636},
  timestamp    = {Thu, 24 Sep 2020 11:28:32 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/LeeNB94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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