@article{DBLP:journals/tcad/LeblebiciK92,
  author    = {Yusuf Leblebici and
               Sung-Mo Kang},
  title     = {Modeling of nMOS transistors for simulation of hot-carrier-induced
               device and circuit degradation},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {11},
  number    = {2},
  year      = {1992},
  pages     = {235-246},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/43.124402},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}