BibTeX record journals/tcad/KungLR20

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@article{DBLP:journals/tcad/KungLR20,
  author       = {Yi{-}Cheng Kung and
                  Kuen{-}Jong Lee and
                  Sudhakar M. Reddy},
  title        = {Generating Single- and Double-Pattern Tests for Multiple {CMOS} Fault
                  Models in One {ATPG} Run},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {39},
  number       = {6},
  pages        = {1340--1345},
  year         = {2020},
  url          = {https://doi.org/10.1109/TCAD.2019.2921345},
  doi          = {10.1109/TCAD.2019.2921345},
  timestamp    = {Thu, 24 Sep 2020 11:28:21 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/KungLR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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