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@article{DBLP:journals/tcad/KrasniewskiP89,
author = {Andrzej Krasniewski and
Slawomir Pilarski},
title = {Circular self-test path: a low-cost BIST technique for VLSI
circuits},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {8},
number = {1},
year = {1989},
pages = {46-55},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.21818},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-06-26 by Michael Ley (ley@uni-trier.de)