@article{DBLP:journals/tcad/Konuk99,
author = {Haluk Konuk},
title = {Voltage- and current-based fault simulation for interconnect
open defects},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {18},
number = {12},
year = {1999},
pages = {1768-1779},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.811326},
bibsource = {DBLP, http://dblp.uni-trier.de}
}