BibTeX record journals/tcad/KimAS05

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@article{DBLP:journals/tcad/KimAS05,
  author       = {Yong Chang Kim and
                  Vishwani D. Agrawal and
                  Kewal K. Saluja},
  title        = {Combinational automatic test pattern generation for acyclic sequential
                  circuits},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {24},
  number       = {6},
  pages        = {948--956},
  year         = {2005},
  url          = {https://doi.org/10.1109/TCAD.2005.847894},
  doi          = {10.1109/TCAD.2005.847894},
  timestamp    = {Thu, 24 Sep 2020 11:27:40 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/KimAS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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