BibTeX record journals/tcad/Jone93

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@article{DBLP:journals/tcad/Jone93,
  author       = {Wen{-}Ben Jone},
  title        = {Defect level estimation of circuit testing using sequential statistical
                  analysis},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {12},
  number       = {2},
  pages        = {336--348},
  year         = {1993},
  url          = {https://doi.org/10.1109/43.205012},
  doi          = {10.1109/43.205012},
  timestamp    = {Thu, 24 Sep 2020 11:27:32 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/Jone93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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