@article{DBLP:journals/tcad/IyengarV92,
author = {Vijay S. Iyengar and
Gopalakrishnan Vijayan},
title = {Optimized test application timing for AC test},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {11},
number = {11},
year = {1992},
pages = {1439-1449},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.177406},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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