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@article{DBLP:journals/tcad/Huisman04,
author = {Leendert M. Huisman},
title = {Diagnosing arbitrary defects in logic designs using single
location at a time (SLAT)},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {23},
number = {1},
year = {2004},
pages = {91-101},
ee = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2003.816206},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-04-26 by Michael Ley (ley@uni-trier.de)