BibTeX record journals/tcad/HsiehLB11

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@article{DBLP:journals/tcad/HsiehLB11,
  author       = {Tong{-}Yu Hsieh and
                  Kuen{-}Jong Lee and
                  Melvin A. Breuer},
  title        = {An Error-Tolerance-Based Test Methodology to Support Product Grading
                  for Yield Enhancement},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {30},
  number       = {6},
  pages        = {930--934},
  year         = {2011},
  url          = {https://doi.org/10.1109/TCAD.2011.2113690},
  doi          = {10.1109/TCAD.2011.2113690},
  timestamp    = {Thu, 24 Sep 2020 11:27:53 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/HsiehLB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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