BibTeX record journals/tcad/HouWCJC23

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@article{DBLP:journals/tcad/HouWCJC23,
  author       = {Tianshu Hou and
                  Ngai Wong and
                  Quan Chen and
                  Zhigang Ji and
                  Hai{-}Bao Chen},
  title        = {Analytical Post-Voiding Modeling and Efficient Characterization of
                  {EM} Failure Effects Under Time-Dependent Current Stressing},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {42},
  number       = {12},
  pages        = {4959--4972},
  year         = {2023},
  url          = {https://doi.org/10.1109/TCAD.2023.3283937},
  doi          = {10.1109/TCAD.2023.3283937},
  timestamp    = {Sun, 10 Dec 2023 17:00:43 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/HouWCJC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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