Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.

Said Hamdioui Zaid Al-Ars A. J. van de Goor Mike Rodgers Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. 737-757 2004 23 IEEE Trans. on CAD of Integrated Circuits and Systems 5 http://doi.ieeecomputersociety.org/10.1109/TCAD.2004.826578 db/journals/tcad/tcad23.html#HamdiouiAGR04