BibTeX
@article{DBLP:journals/tcad/HamdiouiAGR04,
author = {Said Hamdioui and
Zaid Al-Ars and
A. J. van de Goor and
Mike Rodgers},
title = {Linked faults in random access memories: concept, fault
models, test algorithms, and industrial results},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {23},
number = {5},
year = {2004},
pages = {737-757},
ee = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2004.826578},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-04-26 by Michael Ley (ley@uni-trier.de)