@article{DBLP:journals/tcad/GlaserV96,
author = {Uwe Gl{\"a}ser and
Heinrich Theodor Vierhaus},
title = {Mixed level test generation for synchronous sequential circuits
using the FOGBUSTER algorithm},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {15},
number = {4},
year = {1996},
pages = {410-423},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.494704},
bibsource = {DBLP, http://dblp.uni-trier.de}
}