@article{DBLP:journals/tcad/GhoshRJ99,
author = {Indradeep Ghosh and
Anand Raghunathan and
Niraj K. Jha},
title = {Hierarchical test generation and design for testability
methods for ASPPs and ASIPs},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {18},
number = {3},
year = {1999},
pages = {357-370},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.748165},
bibsource = {DBLP, http://dblp.uni-trier.de}
}