@article{DBLP:journals/tcad/GhoshJB00,
author = {Indradeep Ghosh and
Niraj K. Jha and
Sudipta Bhawmik},
title = {A BIST scheme for RTL circuits based on symbolic testabilityanalysis},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {19},
number = {1},
year = {2000},
pages = {111-128},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.822624},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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