BibTeX record: journals/tcad/FujiwaraY93

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@article{DBLP:journals/tcad/FujiwaraY93,
  author    = {Hideo Fujiwara and
               Akihiro Yamamoto},
  title     = {Parity-scan design to reduce the cost of test application},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  year      = {1993},
  volume    = {12},
  number    = {10},
  pages     = {1604--1611},
  url       = {http://doi.ieeecomputersociety.org/10.1109/43.256936},
  doi       = {10.1109/43.256936},
  timestamp = {Tue, 16 Sep 2014 23:50:27 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/tcad/FujiwaraY93},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}