DBLP Record 'journals/tcad/FujiwaraIYO08'

BibTeX

@article{DBLP:journals/tcad/FujiwaraIYO08,
  author    = {Hideo Fujiwara and
               Hiroyuki Iwata and
               Tomokazu Yoneda and
               Chia Yee Ooi},
  title     = {A Nonscan Design-for-Testability Method for Register-Transfer-Level
               Circuits to Guarantee Linear-Depth Time Expansion Models},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {27},
  number    = {9},
  year      = {2008},
  pages     = {1535-1544},
  ee        = {http://dx.doi.org/10.1109/TCAD.2008.927757},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}