@article{DBLP:journals/tcad/FuchsPR94,
author = {Karl Fuchs and
Michael Pabst and
Torsten R{\"o}ssel},
title = {RESIST: a recursive test pattern generation algorithm for
path delay faults considering various test classes},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {13},
number = {12},
year = {1994},
pages = {1550-1562},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.331411},
bibsource = {DBLP, http://dblp.uni-trier.de}
}