DBLP BibTeX Record 'journals/tcad/FuchsPR94'

@article{DBLP:journals/tcad/FuchsPR94,
  author    = {Karl Fuchs and
               Michael Pabst and
               Torsten R{\"o}ssel},
  title     = {RESIST: a recursive test pattern generation algorithm for
               path delay faults considering various test classes},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {13},
  number    = {12},
  year      = {1994},
  pages     = {1550-1562},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/43.331411},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}