Imad A. Ferzli Farid N. Najm Analysis and verification of power grids considering process-induced leakage-current variations. 126-143 2006 25 IEEE Trans. on CAD of Integrated Circuits and Systems 1 http://dx.doi.org/10.1109/TCAD.2005.852665 db/journals/tcad/tcad25.html#FerzliN06