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@article{DBLP:journals/tcad/FavalliD02,
author = {Michele Favalli and
Marcello Dalpasso},
title = {Bridging fault modeling and simulation for deep submicron
CMOS ICs},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {21},
number = {8},
year = {2002},
pages = {941-953},
ee = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2002.800457},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-11 by Michael Ley (ley@uni-trier.de)