Konstantinos I. Diamantaras Niraj K. Jha A new transition count method for testing of logic circuits. 407-410 1991 10 IEEE Trans. on CAD of Integrated Circuits and Systems 3 http://doi.ieeecomputersociety.org/10.1109/43.67794 db/journals/tcad/tcad10.html#DiamantarasJ91