Fulvio Corno Paolo Prinetto Maurizio Rebaudengo Matteo Sonza Reorda GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits. 991-1000 1996 15 IEEE Trans. on CAD of Integrated Circuits and Systems 8 http://doi.ieeecomputersociety.org/10.1109/43.511578 db/journals/tcad/tcad15.html#CornoPRR96