Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.

Jung Hwan Choi Aditya Bansal Mesut Meterelliyoz Jayathi Murthy Kaushik Roy Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. 2059-2068 2007 26 IEEE Trans. on CAD of Integrated Circuits and Systems 11 http://dx.doi.org/10.1109/TCAD.2007.906470 db/journals/tcad/tcad26.html#ChoiBMMR07