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BibTeX record journals/tcad/ChengDK93
@article{DBLP:journals/tcad/ChengDK93, author = {Kwang{-}Ting Cheng and Srinivas Devadas and Kurt Keutzer}, title = {Delay-fault test generation and synthesis for testability under a standard scan design methodology}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {12}, number = {8}, pages = {1217--1231}, year = {1993}, url = {https://doi.org/10.1109/43.238614}, doi = {10.1109/43.238614}, timestamp = {Wed, 07 Dec 2022 23:02:03 +0100}, biburl = {https://dblp.org/rec/journals/tcad/ChengDK93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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