BibTeX record journals/tcad/ChengDK93

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@article{DBLP:journals/tcad/ChengDK93,
  author       = {Kwang{-}Ting Cheng and
                  Srinivas Devadas and
                  Kurt Keutzer},
  title        = {Delay-fault test generation and synthesis for testability under a
                  standard scan design methodology},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {12},
  number       = {8},
  pages        = {1217--1231},
  year         = {1993},
  url          = {https://doi.org/10.1109/43.238614},
  doi          = {10.1109/43.238614},
  timestamp    = {Wed, 07 Dec 2022 23:02:03 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/ChengDK93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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