BibTeX record journals/tcad/ChandraC03

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@article{DBLP:journals/tcad/ChandraC03,
  author       = {Anshuman Chandra and
                  Krishnendu Chakrabarty},
  title        = {A unified approach to reduce {SOC} test data volume, scan power and
                  testing time},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {22},
  number       = {3},
  pages        = {352--363},
  year         = {2003},
  url          = {https://doi.org/10.1109/TCAD.2002.807895},
  doi          = {10.1109/TCAD.2002.807895},
  timestamp    = {Mon, 03 Jan 2022 22:11:41 +0100},
  biburl       = {https://dblp.org/rec/journals/tcad/ChandraC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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