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BibTeX record journals/tcad/ChampacRF94
@article{DBLP:journals/tcad/ChampacRF94, author = {V{\'{\i}}ctor H. Champac and Antonio Rubio and Joan Figueras}, title = {Electrical model of the floating gate defect in {CMOS} ICs: implications on I\({}_{\mbox{DDQ}}\) testing}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {13}, number = {3}, pages = {359--369}, year = {1994}, url = {https://doi.org/10.1109/43.265677}, doi = {10.1109/43.265677}, timestamp = {Thu, 06 Jul 2023 22:32:33 +0200}, biburl = {https://dblp.org/rec/journals/tcad/ChampacRF94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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