@article{DBLP:journals/tcad/BlantonDD06,
  author    = {Ronald D. Blanton and
               Kumar N. Dwarakanath and
               Rao Desineni},
  title     = {Defect Modeling Using Fault Tuples},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {25},
  number    = {11},
  year      = {2006},
  pages     = {2450-2464},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.870836},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}