@article{DBLP:journals/tcad/BlantonDD06,
author = {Ronald D. Blanton and
Kumar N. Dwarakanath and
Rao Desineni},
title = {Defect Modeling Using Fault Tuples},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {11},
year = {2006},
pages = {2450-2464},
ee = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.870836},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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