DBLP Record 'journals/tcad/BahukudumbiC09'

BibTeX

@article{DBLP:journals/tcad/BahukudumbiC09,
  author    = {Sudarshan Bahukudumbi and
               Krishnendu Chakrabarty},
  title     = {Test-Length and TAM Optimization for Wafer-Level Reduced
               Pin-Count Testing of Core-Based SoCs},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {28},
  number    = {1},
  year      = {2009},
  pages     = {111-120},
  ee        = {http://dx.doi.org/10.1109/TCAD.2008.2009150},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}