DBLP Record 'journals/tcad/BaharSNG05'

BibTeX

@article{DBLP:journals/tcad/BaharSNG05,
  author    = {R. Iris Bahar and
               Hui-Yuan Song and
               Kundan Nepal and
               Joel Grodstein},
  title     = {Symbolic failure analysis of complex CMOS circuits due to
               excessive leakage current and charge sharing},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {24},
  number    = {4},
  year      = {2005},
  pages     = {502-515},
  ee        = {http://dx.doi.org/10.1109/TCAD.2005.844105},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}