@article{DBLP:journals/tcad/AyariK94,
  author    = {Bechir Ayari and
               Bozena Kaminska},
  title     = {A new dynamic test vector compaction for automatic test
               pattern generation},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {13},
  number    = {3},
  year      = {1994},
  pages     = {353-358},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/43.265676},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}