dblp.uni-trier.dewww.uni-trier.de

DBLP Record 'journals/tcad/Akers88'

BibTeX

@article{DBLP:journals/tcad/Akers88,
  author    = {Sheldon B. Akers},
  title     = {A parity bit signature for exhaustive testing},
  journal   = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume    = {7},
  number    = {3},
  year      = {1988},
  pages     = {333-338},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/43.3166},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2006-06-27 by Michael Ley (ley@uni-trier.de)