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@article{DBLP:journals/tcad/Akers88,
author = {Sheldon B. Akers},
title = {A parity bit signature for exhaustive testing},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {7},
number = {3},
year = {1988},
pages = {333-338},
ee = {http://doi.ieeecomputersociety.org/10.1109/43.3166},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-06-27 by Michael Ley (ley@uni-trier.de)