Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.

Nisar Ahmed Mohammad Tehranipoor C. P. Ravikumar Kenneth M. Butler Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. 896-906 2007 26 IEEE Trans. on CAD of Integrated Circuits and Systems 5 http://dx.doi.org/10.1109/TCAD.2006.884405 db/journals/tcad/tcad26.html#AhmedTRB07