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@article{DBLP:journals/tcad/AcarO08,
author = {Erkan Acar and
Sule Ozev},
title = {Defect-Oriented Testing of RF Circuits},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {27},
number = {5},
year = {2008},
pages = {920-931},
ee = {http://dx.doi.org/10.1109/TCAD.2008.917578},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-09-19 by Michael Ley (ley@uni-trier.de)