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DBLP BibTeX Record 'journals/tc/SukR80'

@article{DBLP:journals/tc/SukR80,
  author    = {Dong S. Suk and
               Sudhakar M. Reddy},
  title     = {Test Procedures for a Class of Pattern-Sensitive Faults
               in Semiconductor Random-Access Memories},
  journal   = {IEEE Trans. Computers},
  volume    = {29},
  number    = {6},
  year      = {1980},
  pages     = {419-429},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675601},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}