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@article{DBLP:journals/tc/SethAF90,
author = {Sharad C. Seth and
Vishwani D. Agrawal and
Hassan Farhat},
title = {A Statistical Theory of Digital Circuit Testability},
journal = {IEEE Trans. Computers},
volume = {39},
number = {4},
year = {1990},
pages = {582-586},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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