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@article{DBLP:journals/tc/NouraniTA08,
author = {Mehrdad Nourani and
Mohammad Tehranipoor and
Nisar Ahmed},
title = {Low-Transition Test Pattern Generation for BIST-Based Applications},
journal = {IEEE Trans. Computers},
volume = {57},
number = {3},
year = {2008},
pages = {303-315},
ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2007.70794},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-06-05 by Michael Ley (ley@uni-trier.de)