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BibTeX record journals/tc/MeyerP03
@article{DBLP:journals/tc/MeyerP03, author = {Fred J. Meyer and Nohpill Park}, title = {Predicting Defect-Tolerant Yield in the Embedded Core Context}, journal = {{IEEE} Trans. Computers}, volume = {52}, number = {11}, pages = {1470--1479}, year = {2003}, url = {https://doi.org/10.1109/TC.2003.1244944}, doi = {10.1109/TC.2003.1244944}, timestamp = {Sat, 20 May 2017 00:24:35 +0200}, biburl = {https://dblp.org/rec/journals/tc/MeyerP03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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