Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs.

Tülin Erdim Mangir Algirdas Avizienis Fault-Tolerant Design for VLSI: Effect of Interconnect Requirements on Yield Improvement of VLSI Designs. 609-616 1982 31 IEEE Trans. Computers 7 db/journals/tc/tc31.html#MangirA82 http://doi.ieeecomputersociety.org/10.1109/TC.1982.1676058