BibTeX record journals/tc/KinoshitaS86

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@article{DBLP:journals/tc/KinoshitaS86,
  author    = {Kozo Kinoshita and
               Kewal K. Saluja},
  title     = {Built-In Testing of Memory Using an On-Chip Compact Testing Scheme},
  journal   = {{IEEE} Trans. Computers},
  volume    = {35},
  number    = {10},
  pages     = {862--870},
  year      = {1986},
  url       = {http://dx.doi.org/10.1109/TC.1986.1676677},
  doi       = {10.1109/TC.1986.1676677},
  timestamp = {Tue, 22 Dec 2015 15:14:10 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/tc/KinoshitaS86},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}