<?xml version="1.0"?>
<dblp>
<article key="journals/tc/KalayHP00" mdate="2003-11-20">
<author>Ugur Kalay</author>
<author>Douglas V. Hall</author>
<author>Marek A. Perkowski</author>
<title>A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits.</title>
<pages>267-276</pages>
<year>2000</year>
<volume>49</volume>
<journal>IEEE Trans. Computers</journal>
<number>3</number>
<ee>http://www.computer.org:80/tc/tc2000/t0267abs.htm</ee>
<url>db/journals/tc/tc49.html#KalayHP00</url>
</article>
</dblp>
