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@article{DBLP:journals/tc/HuS86,
author = {Mou Hu and
Kenneth C. Smith},
title = {Ternary Scan Design for VLSI Testability},
journal = {IEEE Trans. Computers},
volume = {35},
number = {2},
year = {1986},
pages = {167-170},
ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1986.1676735},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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