BibTeX record journals/tc/HellebrandRTVC95

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@article{DBLP:journals/tc/HellebrandRTVC95,
  author    = {Sybille Hellebrand and
               Janusz Rajski and
               Steffen Tarnick and
               Srikanth Venkataraman and
               Bernard Courtois},
  title     = {Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial
               Linear Feedback Shift Registers},
  journal   = {{IEEE} Trans. Computers},
  volume    = {44},
  number    = {2},
  pages     = {223--233},
  year      = {1995},
  url       = {http://dx.doi.org/10.1109/12.364534},
  doi       = {10.1109/12.364534},
  timestamp = {Tue, 22 Dec 2015 15:14:09 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/tc/HellebrandRTVC95},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}